Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs

A combinational circuit is derived with covering the proper Shared ROBDD by CLBs in the frame of FPGA technology. Single stuck-at faults at the CLBs poles and multiple faults constituted from such single stuck-at faults are considered. It is shown that the test pattern as for single stuck-at fault so for multiple fault there always exists. The test pattern for a multiple fault is the special test pattern for the special single stuck-at fault forming the multiple one. Test for all multiple faults is derived from any test for all single stuck-at faults. The length of the multiple faults test is linear function of the single faults test length. A multiple fault test is the one of high quality. In particular SEU and bridge faults may manifest themselves as multiple faults at the CLBs poles. Deriving test for all multiple faults was executed for the certain bench-marks. For them the length of the multiple faults test is about the twice length of the single faults test.