A set of Virtual Instruments to simulate radiation effects in CMOS circuits

Over the years, it has become necessary to design chips tolerant to radiation effects - circuits that will be used not only by avionics and space industries, but also for chips to be operated at ground level. Single-Event Transients, Single-Event Upsets, Total Ionization Doses are some of the effects due to radiation and heavy ions which affects the electronic systems. It is important to develop new instruments to analyze the radiation effects in CMOS circuits. We developed a set of Virtual Instruments (VI) to be used with LabVIEW. These VIs are use to simulate, measure and observe several radiation-related effects in CMOS circuits.