Title :
Switching loss analysis of closed-loop gate drive
Author :
Chen, Lihua ; Peng, Fang Z.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
In this work, the IGBT turn-on and turn-off waveforms are normalized in order to analyze the closed-loop gate drive switching losses. The relationships of energy losses and controlled switching speed, voltage overshoot, current overshoot are derived. Theoretical analysis results show good agreement with experimental results. The proposed analysis methodology and results can provide guidelines for the gate drive design in real applications.
Keywords :
driver circuits; insulated gate bipolar transistors; switching convertors; closed-loop gate drive; current overshoot; insulated gate bipolar transistors; switching loss analysis; switching speed; voltage overshoot; Breakdown voltage; Circuit testing; Control systems; Drives; Energy loss; Guidelines; Insulated gate bipolar transistors; Power semiconductor switches; Switching loss; Voltage control;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
Conference_Location :
Palm Springs, CA
Print_ISBN :
978-1-4244-4782-4
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2010.5433363
