DocumentCode
187418
Title
How Does the UML Testing Profile Support Risk-Based Testing
Author
Ali, Shady ; Tao Yue ; Hoffmann, Axel ; Wendland, Marc-Florian ; Bagnato, Alessandra ; Brosse, Etienne ; Schacher, Markus ; Zhen Ru Dai
Author_Institution
Simula Res. Lab., Fornebu, Norway
fYear
2014
fDate
3-6 Nov. 2014
Firstpage
311
Lastpage
316
Abstract
The increasing complexity of software-intensive systems raises a lot of challenges demanding new techniques for ensuring their overall quality. The risk of not meeting the expected level of quality has negative impact on business, customers, environment and people, especially in the context of safety/security-critical systems. The importance of risk assessment, analysis and management has been well understood both in the literature and practice, which has led to the definition of a number of well-known standards. In the recent years, Risk-Based Testing (RBT) is gaining more attention, especially focusing on test prioritization and selection based on risks. On the other hand, model-based testing (MBT) provides a systematic and automated way to facilitate rigorous testing of software-intensive systems. MBT has been an intense area of research and a large number of MBT techniques have been developed in literature and practice in the last decade. In this paper, we study the feasibility of combining RBT with MBT by using the upcoming version of UML Testing Profile (UTP 2) as the mechanism. We present potential traceability between RBT and UTP 2 concepts.
Keywords
Unified Modeling Language; program testing; risk analysis; MBT technique; RBT technique; UML testing profile; UTP 2; model-based testing; risk-based testing; software-intensive systems; test prioritization; test selection; Analytical models; Dynamic scheduling; Risk analysis; Security; Standards; Testing; Unified modeling language; Model-based Testing; Risk Assessment; Risk-based Testing; UML Testing Profile;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering Workshops (ISSREW), 2014 IEEE International Symposium on
Conference_Location
Naples
Type
conf
DOI
10.1109/ISSREW.2014.13
Filename
6983859
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