DocumentCode
1874229
Title
Implicit spatial inference with sparse local features
Author
Regan, Deirdre O. ; Kokaram, Anil
Author_Institution
Dept. of Electron. & Electr. Eng., Trinity Coll. Dublin, Dublin
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
2388
Lastpage
2391
Abstract
This paper introduces a novel way to leverage the implicit geometry of sparse local features (e.g. SIFT operator) for the purposes of object detection and segmentation. A two-class Bayesian scheme is used as a framework, and the likelihood is derived from the real-valued classification of machine learning algorithm Gentle AdaBoost, whose output is transformed to a probabilistic distribution using either of two models investigated; Log-Sigmoid or Bi-Gaussian. The main contribution is a novel scheme for the injection of prior contextual spatial information. This occurs on a uniquely designed Markov Random Field defined by Delaunay Tri- angulation of the feature points. Our experiments show that this framework is useful for object detection and segmentation, and we achieve good, mostly invariant results in these tasks.
Keywords
Markov processes; feature extraction; image segmentation; object detection; connected image filtering; edge preservation; image reconstruction; iterated geodesic dilation; mathematical morphology; Bayesian methods; Computer vision; Educational institutions; Feature extraction; Geometry; Machine learning algorithms; Markov random fields; Object detection; Solid modeling; Vocabulary; Bayes procedures; Delaunay triangulation; Feature extraction; Geometric modeling; Object detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1522-4880
Print_ISBN
978-1-4244-1765-0
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2008.4712273
Filename
4712273
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