Title :
Implicit spatial inference with sparse local features
Author :
Regan, Deirdre O. ; Kokaram, Anil
Author_Institution :
Dept. of Electron. & Electr. Eng., Trinity Coll. Dublin, Dublin
Abstract :
This paper introduces a novel way to leverage the implicit geometry of sparse local features (e.g. SIFT operator) for the purposes of object detection and segmentation. A two-class Bayesian scheme is used as a framework, and the likelihood is derived from the real-valued classification of machine learning algorithm Gentle AdaBoost, whose output is transformed to a probabilistic distribution using either of two models investigated; Log-Sigmoid or Bi-Gaussian. The main contribution is a novel scheme for the injection of prior contextual spatial information. This occurs on a uniquely designed Markov Random Field defined by Delaunay Tri- angulation of the feature points. Our experiments show that this framework is useful for object detection and segmentation, and we achieve good, mostly invariant results in these tasks.
Keywords :
Markov processes; feature extraction; image segmentation; object detection; connected image filtering; edge preservation; image reconstruction; iterated geodesic dilation; mathematical morphology; Bayesian methods; Computer vision; Educational institutions; Feature extraction; Geometry; Machine learning algorithms; Markov random fields; Object detection; Solid modeling; Vocabulary; Bayes procedures; Delaunay triangulation; Feature extraction; Geometric modeling; Object detection;
Conference_Titel :
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-1765-0
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2008.4712273