Title :
Modeling and sensitivity analysis for solar grade silicon production
Author :
Du, Juan ; Ydstie, B. Erik
Author_Institution :
Dept. of Chem. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This paper addresses modeling and control strategy for fluidized bed reactors designed to produce poly-silicon for solar cell applications. This reaction process provides a potential alternative to the Siemens process which is widely used in the current poly-silicon solar market. Thermal decomposition of silane takes place in the fluidized bed reactor and seed particles are growing due to the chemical vapor deposition and the scavenging powders generated in homogeneous decomposition. A discretized population balance is developed to describe the dynamics of particles. The model employs ordinary differential and algebraic equations to track particle movement through discrete size intervals to capture the size distributions. A novel sensitivity analysis for the steady state operation is presented to demonstrate the impact of control parameters to the process and is validated via experimental data obtained from pilot plants in Renewable Energy Corporation.
Keywords :
chemical reactors; chemical vapour deposition; differential algebraic equations; elemental semiconductors; fluidised beds; process control; pyrolysis; semiconductor industry; sensitivity analysis; silicon; solar cells; Renewable Energy Corporation; algebraic equations; chemical vapor deposition; control strategy; discretized population balance; fluidized bed reactors; homogeneous decomposition; ordinary differential equations; particle movement tracking; polysilicon production; polysilicon solar market; process control; scavenging powders; seed particle dynamics; sensitivity analysis; silane; solar cell applications; solar grade silicon production; steady state operation; thermal decomposition; Computational modeling; Equations; Inductors; Mathematical model; Production; Silicon; Steady-state;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6186684