DocumentCode
1874335
Title
Matrix Codes: Multiple Bit Upsets Tolerant Method for SRAM Memories
Author
Argyrides, Costas ; Zarandi, Hamid R. ; Pradhan, Dhiraj K.
Author_Institution
Univ. of Bristol, Bristol
fYear
2007
fDate
26-28 Sept. 2007
Firstpage
340
Lastpage
348
Abstract
This paper presents a high level method called Matrix code to protect SRAM-based memories against multiple bit upsets. The proposed method combines hamming code and parity code to assure the reliability of memory in presence of multiple bit-upsets with low area and performance overhead. The method is evaluated using one million multiple-fault injection experiments; next reliability and MTTF of the protected memories are estimated based on fault injection experiments and several equations. The fault detection/correction coverage are also calculated and compared with previous methods i.e., Reed-Muller and hamming code. The results reveal that the proposed method behaves better than these methods in terms of fault detection and correction of multiple faults regarding to the area overhead.
Keywords
Hamming codes; circuit reliability; parity check codes; SRAM memories; hamming code; matrix codes; memory reliability; multiple bit upsets tolerant method; multiple fault injection; parity code; Circuit faults; Costs; Equations; Fault detection; Integrated circuit noise; Integrated circuit technology; Neutrons; Protection; Random access memory; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location
Rome
ISSN
1550-5774
Print_ISBN
978-0-7695-2885-4
Type
conf
DOI
10.1109/DFT.2007.29
Filename
4358403
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