• DocumentCode
    1874335
  • Title

    Matrix Codes: Multiple Bit Upsets Tolerant Method for SRAM Memories

  • Author

    Argyrides, Costas ; Zarandi, Hamid R. ; Pradhan, Dhiraj K.

  • Author_Institution
    Univ. of Bristol, Bristol
  • fYear
    2007
  • fDate
    26-28 Sept. 2007
  • Firstpage
    340
  • Lastpage
    348
  • Abstract
    This paper presents a high level method called Matrix code to protect SRAM-based memories against multiple bit upsets. The proposed method combines hamming code and parity code to assure the reliability of memory in presence of multiple bit-upsets with low area and performance overhead. The method is evaluated using one million multiple-fault injection experiments; next reliability and MTTF of the protected memories are estimated based on fault injection experiments and several equations. The fault detection/correction coverage are also calculated and compared with previous methods i.e., Reed-Muller and hamming code. The results reveal that the proposed method behaves better than these methods in terms of fault detection and correction of multiple faults regarding to the area overhead.
  • Keywords
    Hamming codes; circuit reliability; parity check codes; SRAM memories; hamming code; matrix codes; memory reliability; multiple bit upsets tolerant method; multiple fault injection; parity code; Circuit faults; Costs; Equations; Fault detection; Integrated circuit noise; Integrated circuit technology; Neutrons; Protection; Random access memory; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
  • Conference_Location
    Rome
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-2885-4
  • Type

    conf

  • DOI
    10.1109/DFT.2007.29
  • Filename
    4358403