• DocumentCode
    1874402
  • Title

    Numerical study of the electrostatic field gradients present in various planar emitter field emission configurations relevant to experimental research

  • Author

    Berrios, A.G. ; De Jesus, Joel ; Morell, Gerardo

  • Author_Institution
    Dept. of Phys., Puerto Rico Univ., San Juan, PR, USA
  • fYear
    2004
  • fDate
    11-16 July 2004
  • Firstpage
    114
  • Lastpage
    115
  • Abstract
    In this work, a general finite element software has been used to analyze the electrostatic field in various experimental configurations employed for measuring the field emission properties of planar emitters. The configurations studied are: (1) the metallic sphere-anode, (2) the cylindrical probe with spherically rounded tip, (3) the cylindrical probe with flat tip, (4) the flat anode separated from the cathode by insulating round spacers touching both cathode and anode, (5) flat spacers touching both cathode and anode, and (6) flat spacers touching the anode but not touching the cathode. The validity of the ideal capacitor approximation was investigated for the cathode surface electric field for each configuration using typical dimensions for each of them, and obtained the magnitude of the electric field near critical areas that could lead to residual gas ionization, dielectric breakdown and emission of electrons from non-desired cathode areas.
  • Keywords
    electric breakdown; electron field emission; finite element analysis; ionisation; cathode surface electric; cylindrical probe; dielectric breakdown; electrostatic field gradients; flat anode; flat spacers; flat tip; general finite element software; ideal capacitor approximation; insulating round spacers; metallic sphere-anode; planar emitter field emission configurations; residual gas ionization; spherically rounded tip; Anodes; Capacitors; Cathodes; Electrostatic analysis; Electrostatic measurements; Finite element methods; Insulation; Ionization; Probes; Software measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
  • Print_ISBN
    0-7803-8397-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2004.1354926
  • Filename
    1354926