Title :
A model for performance evaluation in M-QAM-OFDM schemes in prescence of nonlinear distortions
Author :
Santella, Giovanni ; Mazzenga, Franco
Author_Institution :
Fondazione Ugo Bordoni, Rome, Italy
Abstract :
The paper presents a model for a semi-analytic performance evaluation in M-QAM-orthogonal frequency division multiplexing (OFDM) digital radio systems in the presence of an additive white gaussian noise (AWGN) transmission channel and nonlinear distortions due to a high power amplifier (HPA). It is shown that, in the case of an OFDM system with a large number of sub-carriers, the distortion on the received symbol caused by the amplifier can be modelled, with negligible error, as a “Gaussian nonlinear noise” added to the received symbol. Considering this important remark the semi-analytical approach is only used to estimate means and variances of the “nonlinear noise” while these estimated parameters are subsequently used to evaluate the system bit error rate (BER) in a closed form. The advantage of this proposed method is that it strongly reduces the computational time. The proposed procedure is applied to evaluate M-QAM-OFDM performance in presence of nonlinear distortions due to high power amplifiers
Keywords :
Gaussian channels; Gaussian noise; digital radio; electric distortion; error statistics; frequency division multiplexing; land mobile radio; quadrature amplitude modulation; radiofrequency interference; subcarrier multiplexing; AWGN transmission channel; Gaussian nonlinear noise; M-QAM-OFDM schemes; additive white gaussian noise; computational time; digital radio systems; high power amplifier; nonlinear distortions; nonlinear noise; orthogonal frequency division multiplexing; performance evaluation; received symbol; sub-carriers; system bit error rate; AWGN; Additive white noise; Bit error rate; Digital communication; Frequency division multiplexing; Gaussian noise; High power amplifiers; Nonlinear distortion; OFDM; Power system modeling;
Conference_Titel :
Vehicular Technology Conference, 1995 IEEE 45th
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-2742-X
DOI :
10.1109/VETEC.1995.504984