DocumentCode
1874475
Title
A Scalable Framework for Defect Isolation of DNA Self-assemlbled Networks
Author
Fukushi, Masaru ; Horiguchi, Shogo ; Demoracski, Luke ; Lombardi, Fabrizio
Author_Institution
Tohoku Univ., Sendai
fYear
2007
fDate
26-28 Sept. 2007
Firstpage
391
Lastpage
399
Abstract
This paper presents and evaluates an approach for defect isolation of DNA self-assembled networks made of a large number of processing nodes. A previous framework based on a broadcast algorithm isolates defective nodes by using no redundancy (for the nodes) and an external defect map. Its disadvantage is the limited scalability, thus making it unsuitable for extremely large scale networks built through DNA self-assembly. Our framework improves upon the previous framework by involving three algorithmic tiers; namely, 1-hop wave expansion, efficient via placement, and unsafe node defection. The efficiency of the proposed framework is evaluated and compared with the original framework by considering large scale networks (up to 1000 times 1000 nodes), and a novel gross defect model (as well as the conventional random defect model assumed in previous manuscripts). Simulation results indicate that the proposed framework outperforms the original framework in broadcast latency and coverage, and shows excellent scalability features for DNA self-assembled nano-scale networks.
Keywords
DNA; biomolecular electronics; nanoelectronics; self-assembly; 1-hop wave expansion; DNA self-assembled networks; broadcast algorithm; defect isolation; electronic nano-scale devices; external defect map; gross defect model; large-scale networks; nano-scale networks; unsafe node defection; Broadcasting; DNA; Large-scale systems; Lithography; Manufacturing; Nanoscale devices; Optical network units; Redundancy; Scalability; Self-assembly;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location
Rome
ISSN
1550-5774
Print_ISBN
978-0-7695-2885-4
Type
conf
DOI
10.1109/DFT.2007.38
Filename
4358408
Link To Document