• DocumentCode
    1874519
  • Title

    Fault Secure Encoder and Decoder for Memory Applications

  • Author

    Naeimi, Helia ; DeHon, André

  • Author_Institution
    California Inst. of Technol., Pasadena
  • fYear
    2007
  • fDate
    26-28 Sept. 2007
  • Firstpage
    409
  • Lastpage
    417
  • Abstract
    We introduce a reliable memory system that can tolerate multiple transient errors in the memory words as well as transient errors in the encoder and decoder (corrector) circuitry. The key novel development is the fault-secure detector (FSD) error-correcting code (ECC) definition and associated circuitry that can detect errors in the received encoded vector despite experiencing multiple transient faults in its circuitry. The structure of the detector is general enough that it can be used for any ECC that follows our FSD-ECC definition. We prove that two known classes of Low-Density Parity-Check Codes have the FSD-ECC property: Euclidean Geometry and Projective Geometry codes. We identify a specific FSD-LDPC code that can tolerate up to 33 errors in each memory word or supporting logic that requires only 30% area overhead for memory blocks of 10 Kbits or larger. Larger codes can achieve even higher reliability and lower area overhead. We quantify the importance of protecting encoder and decoder (corrector) circuitry and illustrate a scenario where the system failure rate (FIT) is dominated by the failure rate of the encoder and decoder.
  • Keywords
    error correction codes; integrated memory circuits; logic testing; parity check codes; Euclidean geometry code; error-correcting code; fault secure decoder; fault secure encoder; fault-secure detector; low-density parity-check codes; memory words; multiple transient errors; projective geometry code; reliable memory system; Circuit faults; Decoding; Detectors; Electrical fault detection; Error correction; Error correction codes; Fault detection; Geometry; Logic; Parity check codes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
  • Conference_Location
    Rome
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-2885-4
  • Type

    conf

  • DOI
    10.1109/DFT.2007.54
  • Filename
    4358410