Title :
Toward SIL Evaluation for a Resilience Strategy
Author :
Ling Fang ; Guoqiang Li ; Yingjie You ; Chaobin Chen ; Liqin Hu
Author_Institution :
Key Lab. of Neutronics & Radiat. Safety, Inst. of Nucl. Energy Safety Technol., Hefei, China
Abstract :
It is not rare that a Micro Processor Unit (MPU) receives an electric noise, and caused the function malfunction or freezing. A novelty resilience strategy is proposed in order to reduce the risk of error caused by noise and improve the system safety. Safety Integrity Level (SIL) is the part of the overall safety of a system or piece of equipment. This paper describes a resilience strategy against electronic noise and proposes several consideration toward the SIL evaluation.
Keywords :
microprocessor chips; software reliability; MPU; SIL evaluation; electric noise; microprocessor unit; resilience strategy; safety integrity level; Hardware; Noise; Reliability; Resilience; Safety; Software; Testing; Resilience Strategy; SIL Evaluation; Safety Function;
Conference_Titel :
Software Reliability Engineering Workshops (ISSREW), 2014 IEEE International Symposium on
Conference_Location :
Naples
DOI :
10.1109/ISSREW.2014.41
