Title :
Are there any alternatives to “known good die” ? [MCMs]
Author :
Gattiker, Anne E. ; Maly, Wojciech ; Thomas, Michael E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This paper presents a cost-based methodology for assessing the effectiveness of various MCM implementation strategies. It is focused on testing. Two approaches to the MCM testing problem are investigated in detail. One is based on the assumption that system components are perfect(“known good die” approach) and the other uses the “smart substrate” concept. An MCM using a smart substrate is one in which the substrate contains active circuitry for carrying out testing functions. For these two testing options, the obtained results suggest the existence of “windows of opportunity” for both KGD and smart substrate solutions
Keywords :
built-in self test; costing; economics; integrated circuit manufacture; integrated circuit testing; multichip modules; MCM implementation strategies; MCM testing; active circuitry; cost model; cost-based methodology; known good die concept; smart substrate; Assembly; Circuit testing; Controllability; Costs; Environmental economics; Manufacturing; Observability; Packaging; Pins; Substrates;
Conference_Titel :
Multi-Chip Module Conference, 1994. MCMC-94, Proceedings., 1994 IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-5560-7
DOI :
10.1109/MCMC.1994.292519
