• DocumentCode
    187516
  • Title

    Failure analysis of two-bit flipping decoding algorithms

  • Author

    Vasic, Bane ; Nguyen, Duc V.

  • Author_Institution
    Dept. of ECE, Univ. of Arizona, Tucson, AZ, USA
  • fYear
    2014
  • fDate
    22-25 July 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We consider a class of bit flipping algorithms for low-density parity-check codes over the binary symmetric channel in which one additional bit at a variable and check nodes is employed. For these two-bit flipping algorithms, we give and illustrate through examples a recursive procedure for finding all uncorrectable error patters and corresponding induced subgraphs, referred as a trapping set profile. This procedure is used to select a small collection of good algorithms that in a decoding diversity approach, run in parallel or serial, outperform Gallager A/B, min-sum and sum product algorithm in the error floor region.
  • Keywords
    decoding; parity check codes; binary symmetric channel; decoding diversity approach; low-density parity-check codes; recursive procedure; two-bit flipping decoding algorithms; Algorithm design and analysis; Charge carrier processes; Decoding; Indexes; Iterative decoding; Vectors; Bit flipping algorithms; error floor; low-density parity-check codes; trapping set;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Communications (SPCOM), 2014 International Conference on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4799-4666-2
  • Type

    conf

  • DOI
    10.1109/SPCOM.2014.6983914
  • Filename
    6983914