DocumentCode :
187516
Title :
Failure analysis of two-bit flipping decoding algorithms
Author :
Vasic, Bane ; Nguyen, Duc V.
Author_Institution :
Dept. of ECE, Univ. of Arizona, Tucson, AZ, USA
fYear :
2014
fDate :
22-25 July 2014
Firstpage :
1
Lastpage :
5
Abstract :
We consider a class of bit flipping algorithms for low-density parity-check codes over the binary symmetric channel in which one additional bit at a variable and check nodes is employed. For these two-bit flipping algorithms, we give and illustrate through examples a recursive procedure for finding all uncorrectable error patters and corresponding induced subgraphs, referred as a trapping set profile. This procedure is used to select a small collection of good algorithms that in a decoding diversity approach, run in parallel or serial, outperform Gallager A/B, min-sum and sum product algorithm in the error floor region.
Keywords :
decoding; parity check codes; binary symmetric channel; decoding diversity approach; low-density parity-check codes; recursive procedure; two-bit flipping decoding algorithms; Algorithm design and analysis; Charge carrier processes; Decoding; Indexes; Iterative decoding; Vectors; Bit flipping algorithms; error floor; low-density parity-check codes; trapping set;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing and Communications (SPCOM), 2014 International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4799-4666-2
Type :
conf
DOI :
10.1109/SPCOM.2014.6983914
Filename :
6983914
Link To Document :
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