DocumentCode :
1875472
Title :
Instrumentation and methodology for revision of European flicker threshold
Author :
Díez, G. ; Eguíluz, L.I. ; Mañana, M. ; Lavandero, J.C. ; Ortiz, A.
Author_Institution :
Dept. of Electr. Eng., Cantabria Univ., Santander, Spain
Volume :
1
fYear :
2002
fDate :
6-9 Oct. 2002
Firstpage :
262
Abstract :
The European standard CENELEC EN 50160 establishes that the severity of flicker caused by voltage fluctuations, under normal operating conditions, will not exceed the long term severity Plt=1 during 95% of the time in one week. This threshold was originally established considering that a lamp with tungsten filament of 60 W and 240 V, produces a flicker perceivable by 50% of the population when it is supplied with a voltage that verifies Plt=1. This work makes an analysis of this threshold, establishing as hypothesis the fact that incandescent lamps have little use nowadays, specially in industrial and commercial environments. In order to make a revision of the current thresholds, we have proposed an electro-optical equipment and the associated methodology. The device simulates the behavior of the eye plus human brain set, avoiding large clinical experiments. A methodology is also proposed in order to characterize the perceptibility threshold of a generic lamp. Finally, the proposed instrumentation and methodology is applied to two types of lamps: incandescent and fluorescent.
Keywords :
electro-optical devices; filament lamps; fluctuations; fluorescent lamps; instrumentation; photodiodes; power supply quality; visual perception; 240 V; 60 W; European flicker threshold; European standard CENELEC EN 50160; commercial environment; current threshold; electro-optical equipment; fluorescent lamps; generic lamp; human eye-brain set; incandescent lamps; industrial environment; instrumentation; long term severity; perceptibility threshold; photodiode; tungsten filament; voltage fluctuations; Brain modeling; Fluorescent lamps; Frequency; Humans; Instruments; Photodiodes; Standards; Threshold voltage; Tungsten; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Harmonics and Quality of Power, 2002. 10th International Conference on
Print_ISBN :
0-7803-7671-4
Type :
conf
DOI :
10.1109/ICHQP.2002.1221442
Filename :
1221442
Link To Document :
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