Title :
Adaptive Wearout Management with in-situ aging monitors
Author :
Huard, Vincent ; Cacho, F. ; Giner, F. ; Saliva, M. ; Benhassain, A. ; Patel, Dinesh ; Torres, N. ; Naudet, S. ; Jain, Abhishek ; Parthasarathy, C.
Author_Institution :
STMicroelectron., Crolles, France
Abstract :
In this work, the fundamental elements towards an Adaptive Wearout Management (AWM) of digital circuits are presented including a new generation of in-situ aging monitors. The warning flags allow circuits to execute instructions in a fault-free way with large power savings up to 40%.
Keywords :
ageing; digital integrated circuits; AWM; adaptive wearout management; digital circuits; in-situ aging monitors; warning flags; Delays; IP networks; Latches; Monitoring; Temperature measurement; Temperature sensors; DTCM; adaptive regulation; control loop; in-situ monitors; wearout;
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
DOI :
10.1109/IRPS.2014.6861106
