Digital model extraction from measurements

This paper focuses on modeling digital devices (from simple digital gates to microprocessors and related components) for signal integrity simulation and analysis. Of concern are the analog input and output interfaces and timing information rather than the logic relationships. The models are used to analyze critical high-speed interconnection paths associated with printed circuit board layout, backplanes, connectors and terminations. While other sources already exist for developing models, this paper shows that measurements provide crucial modeling information. A hardware and software system for semi-automatically developing models is discussed