DocumentCode :
1875845
Title :
Dynamics of time-resolved reststrahl band reflectivity in semiconductors
Author :
Cho, G.C. ; Han, P.Y. ; Bakker, H.J. ; Zhang, X.-C.
Author_Institution :
Dept. of Phys., Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
1999
fDate :
28-28 May 1999
Firstpage :
494
Abstract :
Summary form only given. The recent development of coherent terahertz (THz) measurement technique in the time domain has opened a way to study coherent light-matter interaction in the infrared frequency range. By using free-space electro-optic sampling technique broadband detection up to 37 THz has been demonstrated. We report on the time-resolved coherent waveform of subpicosecond infrared pulse in the reststrahl bands of polar semiconductors. We observe strong oscillations at a frequency near longitudinal optical phonons in the reflection. The damping time constants of the oscillations are shown to be comparable to those of coherent phonons. Analysing the data in different time windows gives us dynamic information on the reststrahl band optical property mediated by phonons.
Keywords :
III-V semiconductors; infrared spectra; phonon spectra; polar semiconductors; reflectivity; time resolved spectra; Fresnel equation; III-V semiconductors; broadband detection; coherent light-matter interaction; coherent phonon dynamics; damping time constants; free-space electro-optic sampling; longitudinal optical phonons; phonon mediated property; polar semiconductors; strong frequency oscillations; subpicosecond infrared pulse; time-resolved coherent waveform; time-resolved reststrahl band reflectivity; Damping; Data analysis; Frequency; Information analysis; Measurement techniques; Optical pulses; Optical reflection; Phonons; Reflectivity; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-595-1
Type :
conf
DOI :
10.1109/CLEO.1999.834495
Filename :
834495
Link To Document :
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