DocumentCode :
1876040
Title :
Comparison of noise and emission characteristics between individually operated NbC/Nb and Ir field emitter array cathodes and etched W[100] emitters
Author :
Charbonnier, Francis ; Southall, Larry A. ; Mackie, William A.
Author_Institution :
Appl. Phys. Technol., Inc., McMinnville, OR, USA
fYear :
2004
fDate :
11-16 July 2004
Firstpage :
230
Lastpage :
231
Abstract :
Oriented single crystal tungsten field emitters mounted on a filament were fabricated using electrolytic etch. The emission pattern of the W emitters was observed and recorded using digital movie camera, allowing the correlation of phosphor patterns with continuous current data. The W tips were operated at room temperature and at temperatures up to 1000 K. Current fluctuations relative to the mean within consecutive short time segments were recorded and their distribution was plotted. The mean ΔI/I was determined as a function of residual pressure. I(V) characteristics were measured. Emission stability was analyzed using s-i charts. The results were compared to the short-term current fluctuations previously observed from single NbC/Nb field emitters.
Keywords :
current fluctuations; etching; field emission; field emitter arrays; niobium; niobium compounds; phosphors; tungsten; 20 degC; I(V) characteristics; Nb; NbC; NbC/Nb field emitter; W; W tips; current fluctuations; electrolytic etch; emission pattern; emission stability; etched W[100] emitters; noise; oriented single crystal tungsten field emitters; phosphor patterns; residual pressure; s-i charts; Cathodes; Digital cameras; Etching; Field emitter arrays; Fluctuations; Motion pictures; Niobium compounds; Phosphors; Temperature distribution; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
Print_ISBN :
0-7803-8397-4
Type :
conf
DOI :
10.1109/IVNC.2004.1354988
Filename :
1354988
Link To Document :
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