• DocumentCode
    187608
  • Title

    A physical and scalable aging model for digital library characterization

  • Author

    Kufluoglu, H. ; Cirba, C. ; Chu, Michael ; Chen, Mei ; Datla, S. ; Reddy, Veerababu

  • Author_Institution
    Analog Technol. Dev., Texas Instrum., Dallas, TX, USA
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Abstract
    A method of incorporating NBTI, PBTI or CHC aging in digital library characterization is presented. This new model gives physical trends under dynamic VDD and temperature profiles. The aging model is directly compatible with existing library characterization flow and the computation time is practically unchanged.
  • Keywords
    ageing; integrated circuit modelling; integrated circuit reliability; negative bias temperature instability; CHC aging; NBTI aging; PBTI aging; channel hot carrier reliability; digital library characterization; negative bias temperature instability; physical aging model; positive bias temperature instability; scalable aging model; Aging; Computational modeling; Degradation; Integrated circuit modeling; Libraries; SPICE; Temperature measurement; HCI; NBTI; PBTI; circuit aging; compact model; degradation; digital library characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2014 IEEE International
  • Conference_Location
    Waikoloa, HI
  • Type

    conf

  • DOI
    10.1109/IRPS.2014.6861124
  • Filename
    6861124
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=187608