DocumentCode :
1876178
Title :
Effectiveness of Knowledge Module on “Intel 45 nm transistor and high-k dielectric” into undergraduate semiconductor devices course
Author :
Siyambalapitiya, Chamila ; Hyde, Robert H. ; Kusmierek, Kristin ; Bhanja, Sanjukta
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
fYear :
2012
fDate :
19-19 March 2012
Firstpage :
83
Lastpage :
87
Abstract :
This work is an effort to evaluate the student awareness, knowledge, and interest concerning recent technological advancements, and also to foster interest toward the emerging technologies in the field related to their conventional courses. Senior level undergraduate students who are taking the Semiconductor Devices course participated in the study. We introduce one of the recent advancements in the semiconductor device field, “Intel 45 nm transistor and high-k dielectric,” through a brief one-lecture Knowledge Module (KM). Our knowledge module consists of a lecture, pre- and post-module assessments and evaluations containing a technical questionnaire and feedback surveys to measure knowledge acquisition and effectiveness of the module. The outcomes indicate a significant increase of interest about the technology and positive feedback on the module. Our future effort would measure retention, sample diversity and quantification for increased interest through statistical analysis.
Keywords :
engineering education; semiconductor devices; statistical analysis; transistors; Intel transistor; feedback surveys; high-k dielectric; knowledge acquisition; knowledge module effectiveness; positive feedback; post-module assessments; post-module assessments evaluations; premodule assessments; premodule evaluations; senior level undergraduate students; size 45 nm; statistical analysis; student awareness evaluation; student interest evaluation; student knowledge evaluation; technical questionnaire; technological advancements; undergraduate semiconductor devices course; Dielectrics; High K dielectric materials; Industries; Logic gates; Transistors; Intel; Module; Semiconductor; Survey; high-k; transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Interdisciplinary Engineering Design Education Conference (IEDEC), 2012 2nd
Conference_Location :
Sanata Clara, CA
Print_ISBN :
978-1-4673-0841-0
Type :
conf
DOI :
10.1109/IEDEC.2012.6186928
Filename :
6186928
Link To Document :
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