Title :
Observation of electron emission pattern from nano-split emitter fabricated using beam assisted process
Author :
Murakami, K. ; Yamasaki, N. ; Abo, S. ; Wakaya, E. ; Takai, M.
Author_Institution :
Res. Center for Mater. Sci. at Extreme Conditions, Osaka Univ., Japan
Abstract :
The possibility of interference of electrons from a nano-split emitter fabricated using beam assisted processes has been investigated. With the gap size of 16 nm, the emission pattern with two spots was observed at a gate voltage close to the turn-on voltage. At the higher gate voltages, two spots become overlapped but no interference fringes were observed at room temperature.
Keywords :
electron field emission; nanostructured materials; platinum; 16 nm; Pt; beam assisted process; electron emission pattern; electron interference; gap size; gate voltage; interference fringes; nanosplit emitter; turn-on voltage; Electrodes; Electromagnetic interference; Electron beams; Electron emission; Gold; Materials science and technology; Phosphors; Temperature measurement; Visualization; Voltage;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
Print_ISBN :
0-7803-8397-4
DOI :
10.1109/IVNC.2004.1354994
