• DocumentCode
    1876234
  • Title

    Reliability evaluation of three-level inverters

  • Author

    Ding, Yi ; Loh, Poh Chiang ; Tan, Kuan Khoon ; Wang, Peng ; Gao, Feng

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    1555
  • Lastpage
    1560
  • Abstract
    To date, many inverter topologies have been proposed in the literature with each exhibiting certain advantages and disadvantages. These inverters are however mostly proposed with their reliability indexes left unexplored. The main reason for a lack of reliability assessment might be a lack of existing quantitative techniques that can be used for computing a mathematical index for associating with the inverter topology under consideration. Without the relevant mathematical index, comparing of inverter reliability is generally impossible or merely based on qualitative reasoning, which at times is subjective to individual preferences. Aiming to address that issue on reliability assessment, this paper proposes an appropriate method based on multi-state computation, uniquely fine-tuned for inverter (or general converter) evaluation. To demonstrate its applications, the formulated method is indifferently used for computing the reliability indexes / models of existing single-phase and three-phase three-level inverters to provide a common ground for their reliability evaluation. For inverters with possibilities of raising their indexes, topological and modulation modifications are proposed with their practicality and performance verified in simulation and experimentally.
  • Keywords
    invertors; network topology; reliability; inverter topology; modulation modifications; multistate computation; qualitative reasoning; reliability assessment; reliability evaluation; reliability index; single-phase three-level inverters; three-phase three-level inverters; Circuit faults; Circuit topology; Computational modeling; Costs; Electromagnetic interference; Hardware; Inverters; Military computing; Reliability engineering; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
  • Conference_Location
    Palm Springs, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-4782-4
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2010.5433438
  • Filename
    5433438