Title :
Focusing of sub 10 fs laser pulses with microscope objectives
Author :
Jasapara, J. ; Maneshi, S. ; Rudolph, W.
Author_Institution :
Dept. of Phys. & Astron., New Mexico Univ., Albuquerque, NM, USA
Abstract :
Summary form only given. Tight focusing of femtosecond pulses is important for a variety of applications such as nonlinear microscopy. Spectral interferometry was applied to study the two chromatic aberration effects of a 100X/0.85 (Zeiss) microscope objective. A maximum delay of about 23 fs between pulses propagating along the optic axis and along the marginal rays is obtained. The spectral interferogram also yielded information on the second and third order (radius independent) group delay dispersion. These data were used to optimize a prism sequence third-order-dispersion mirror combination to pre-chirp the 9.2 fs pulses from a mode locked Ti:sapphire laser.
Keywords :
chirp modulation; high-speed optical techniques; laser mirrors; laser mode locking; light interferometry; optical dispersion; optical focusing; optical microscopes; optical modulation; optical prisms; solid lasers; 23 fs; 9.2 fs; Zeiss microscope objective; chromatic aberration effects; fs laser pulse focusing; marginal rays; microscope objectives; mode locked Ti:sapphire lase; nonlinear microscopy; optic axis; pre-chirp; prism sequence third-order-dispersion mirror combination; second order radius independent group delay dispersion; spectral interferogram; spectral interferometry; third order group delay dispersion; Apertures; Autocorrelation; Delay; Dispersion; Laser theory; Nonlinear optics; Optical interferometry; Optical microscopy; Optical pulses; Pulse measurements;
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-595-1
DOI :
10.1109/CLEO.1999.834510
