• DocumentCode
    1876315
  • Title

    Optimization of electron field emission from carbon nanotube paste

  • Author

    Kim, Yong C. ; Sohn, K.H. ; Cho, Y.M. ; Yoo, E.H.

  • Author_Institution
    Digital Display Lab., LG Electron., Seoul, South Korea
  • fYear
    2004
  • fDate
    11-16 July 2004
  • Firstpage
    250
  • Lastpage
    251
  • Abstract
    Photosensitive organic binder was mixed with well-dispersed arc discharged single-walled carbon nanotubes (CNTs). The CNT-paste was screen-printed on the Cr-patterned glass substrate. Following back-side UV exposure, binder burn-out processes were carried out for accurate and fine patterning of paste. Emission images were obtained from a cathode successively: (a) as-prepared, (b) just after rubber-roll treatment and (c) after multiple I-V cycling. Improvement of emission properties with I-V cycling was observed from scanning electron micrographs (SEM) and I-V curves. The morphology of printed-CNTs was remarkably changed after I-V cycling. Parallel alignment of CNTs to the field direction become permanent after multiple field emission cycles. The field emission threshold was about 2.5 V·μm-1 for the first measurement. In the successive emission cycles, the threshold fields decreased gradually to 1.9 V·μm-1 for the final 13th cycle. From the corresponding Fowler-Nordheim plots, the field enhancement factor (β) of each line was evaluated. The average β values monotonically increased (from 1366 to 2120) with field emission repetition, which again confirmed the gradual vertical alignment of CNTs by multiple I-V cycles.
  • Keywords
    carbon nanotubes; disperse systems; electron field emission; scanning electron microscopy; surface treatment; thick films; ultraviolet radiation effects; C; Cr-patterned glass substrate; Fowler-Nordheim plots; SiO2; aligned carbon nanotubes; arc discharged single-walled carbon nanotubes; back-side UV exposure; binder burn-out process; carbon nanotube paste; electron field emission optimization; emission images; field emission threshold field; field enhancement factor; morphology; multiple I-V cycling; photosensitive organic binder; rubber-roll treatment; scanning electron micrographs; screen-printing; Carbon nanotubes; Electron emission; Flat panel displays; Focusing; Glass; Ion beams; Powders; Rubber; Surface emitting lasers; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
  • Print_ISBN
    0-7803-8397-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2004.1354999
  • Filename
    1354999