Title :
New methodology for drift analysis on reliability trial
Author :
De Tomasi, M. ; Vaion, R.E. ; Cola, L. ; Zabberoni, P. ; Mervic, A.
Author_Institution :
STMicroelectron., Agrate Brianza, Italy
Abstract :
Reliability requirements are becoming more and more demanding and drift analysis after reliability stress is increasing its importance as key process to judge reliability results, in accordance to robust validation guidelines. This work is focused on the developing of a new methodology to perform drift analysis after reliability stress in order to assess if a meaningful drift is present between data before and after stress.
Keywords :
automobile industry; consecutive system reliability; stress analysis; vehicle dynamics; drift analysis; key process; reliability stress; reliability trial; Aging; Gaussian distribution; Qualifications; Robustness; Standards; Stress; Drift analysis; reliability; robust validation;
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
DOI :
10.1109/IRPS.2014.6861137