• DocumentCode
    187637
  • Title

    Is your silicon reliable? A system approach of silicon qualification methodology

  • Author

    Haiying Yu ; Curtis, Alden ; Marathe, A. ; Master, R.

  • Author_Institution
    Device & Studio Div., Microsoft Corp., Mountain View, CA, USA
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Abstract
    An interactive custom silicon qualification methodology is presented to address the reliability and quality challenges faced by system companies and their custom silicon component suppliers. The methodology helps to increase transparency and mutual understanding, and also to identify gaps and set appropriate expectations between them. Two XBOX 360 case studies are described to demonstrate the benefits of the interactive qualification methodology with silicon suppliers compared to an independent and decoupled qualification effort from silicon suppliers without consideration of system requirements. A Kinect CMOS image sensor case study shows the effectiveness of the proposed interactive system approach of silicon qualification methodology, and its implementation that leads to a win-win situation for both the system and component companies. A new CMOS image sensor qualification methodology is introduced.
  • Keywords
    CMOS image sensors; elemental semiconductors; integrated circuit reliability; silicon; Kinect CMOS image sensor; Si; XBOX 360; interactive custom silicon qualification methodology; interactive system approach; Companies; Qualifications; Reliability; Silicon; Stress; Temperature sensors; Testing; CM; FCT; ICT; Qualification methodology; customized silicon components; image sensor; quality; reliability; systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2014 IEEE International
  • Conference_Location
    Waikoloa, HI
  • Type

    conf

  • DOI
    10.1109/IRPS.2014.6861139
  • Filename
    6861139