• DocumentCode
    1876785
  • Title

    Characterizing the Effect of Microarchitecture Design Parameters on Workload Dynamic Behavior

  • Author

    Cho, Chang-Burm ; Zhang, Wangyuan ; Li, Tao

  • Author_Institution
    Univ. of Florida, Gainesville
  • fYear
    2007
  • fDate
    27-29 Sept. 2007
  • Firstpage
    5
  • Lastpage
    14
  • Abstract
    Program runtime behavior exhibits significant variations across multiple scales. The increasing design complexity and technology scaling make microprocessor performance and efficiency increasingly depend on runtime workload dynamics. Therefore understanding the effect of design parameters on workload dynamics at early, microarchitecture exploration stage is crucial for high-performance and complexity-efficient designs. In this study, we apply wavelet-based analysis to decompose workload dynamics into a series of wavelet coefficients, which represent program behavior ranging from low-resolution approximation to high-resolution detail. We then construct error-bounded linear regression models that relate microarchitecture design parameters to various wavelet coefficients that capture workload dynamics at multiresolution levels. The most significant factors affecting program dynamics at different scales are obtained. To our knowledge, this paper presents the first work on microarchitecture design space exploration focusing on workload dynamics.
  • Keywords
    data flow analysis; microcomputers; regression analysis; error-bounded linear regression models; microarchitecture design parameters; program dynamics; program runtime behavior; runtime workload dynamics; wavelet coefficients; wavelet-based analysis; workload dynamic behavior; Linear regression; Microarchitecture; Microprocessors; Out of order; Process design; Runtime; Space exploration; Wavelet analysis; Wavelet coefficients; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Workload Characterization, 2007. IISWC 2007. IEEE 10th International Symposium on
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-1561-8
  • Electronic_ISBN
    978-1-4244-1562-5
  • Type

    conf

  • DOI
    10.1109/IISWC.2007.4362176
  • Filename
    4362176