Title :
Face Classification Using Sparse Reconstruction Embedding
Author :
Liang, Mingjiang ; Zhuang, Yu ; Cai, Cheng
Author_Institution :
Sch. of Manage., Northwestern Polytech. Univ., Xi´´an, China
Abstract :
Face classification is an active and important research area in image processing, pattern classification and computer vision, since it is widely used in real-world application. In general, face classification framework consists of feature extraction and classifier, while feature extraction method is considered critical to the performance of the classifier. Traditional face classification frameworks used to employ the classical methods such as Principle Component Analysis (PCA) and Laplacian Eigenmap for feature extraction. In order to achieve better performance of face classification, we propose a new framework based on Sparse Reconstruction Embedding (SRE) method. In our framework, we firstly use maximum likelihood estimator(MLE) to estimate the optimal dimensionality of the data, and then use SRE to obtain the low-dimensional representations, finally, Quadratic discriminant classifier (QDC) is employed to compute the classification model. We conduct experiments on publicly available database to examine the efficacy of the proposed framework.
Keywords :
Laplace equations; eigenvalues and eigenfunctions; face recognition; feature extraction; image classification; image reconstruction; image representation; maximum likelihood estimation; principal component analysis; Laplacian eigenmap; computer vision; face classification framework; feature extraction; image processing; low dimensional representations; maximum likelihood estimator; optimal dimensionality; pattern classification; principle component analysis; quadratic discriminant classifier; sparse reconstruction embedding; Databases; Error analysis; Face; Feature extraction; Image reconstruction; Laplace equations; Principal component analysis;
Conference_Titel :
Computational Intelligence and Software Engineering (CiSE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5391-7
Electronic_ISBN :
978-1-4244-5392-4
DOI :
10.1109/CISE.2010.5677037