• DocumentCode
    1877343
  • Title

    Fault tolerance on interleaved inverter with magnetic couplers

  • Author

    Guépratte, K. ; Frey, D. ; Jeannin, P-O. ; Stephan, H. ; Ferrieux, J.-P.

  • Author_Institution
    Grenoble Electr. Eng. (G2Elab), Thales Syst. Aeroportes, Grenoble, France
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    1817
  • Lastpage
    1824
  • Abstract
    The paper focuses on a new control strategy for improving the availability of power electronic converters based on interleaved structures. By using this strategy, the power electronic converters can continue to work (with reduced output power) in case of power component failure. The paper describes how to adapt the magnetic output filtering structure for this original control strategy. This structure is based on a monolithic coupler or a coupling transformer. Which are usually employed to minimize in a significant way the mass of the converters. They are normally sized to work with a fixed number of phases. Our control strategy induces new constraints on magnetic component, especially saturation problems. To reduce this problem some extra switch are added. Finally an experimental Power electronic converter driven by an FPGA is presented with the experimental results. It shows some experimental results with a 6 phases converter who work with 5 or 4 phases, to simulate one or two converter leg breakdown.
  • Keywords
    electric connectors; fault tolerance; field programmable gate arrays; invertors; magnetic devices; power convertors; transformers; FPGA; coupling transformer; fault tolerance; interleaved inverter; magnetic couplers; monolithic coupler; power component failure; power electronic converters; Circuit faults; Couplers; Fault tolerance; Filtering; Inverters; Magnetic separation; Power electronics; Power generation; Saturation magnetization; Switches; Interleaved; Power converters; Power efficiency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
  • Conference_Location
    Palm Springs, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-4782-4
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2010.5433480
  • Filename
    5433480