A new efficient method for characterizing time constants of switching oxide traps

In this paper, a new method named Incremental Trap-Response (ITR) is proposed for characterizing the time constants of switching oxide traps, which can be used to expand the voltage detectable window of RTN. Both theoretical and experimental results demonstrate that the new ITR method has higher accuracy and is more time-efficient than recently proposed Statistical Trap-Response (STR) method, thus is helpful for trap-related research on both reliability and variability.