• DocumentCode
    1877371
  • Title

    EM characterization of Raspberry-like nanocluster metamaterials

  • Author

    Vallecchi, A. ; Albani, M. ; Capolino, F.

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Siena, Siena, Italy
  • fYear
    2010
  • fDate
    11-17 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This work investigates certain electromagnetic (EM) properties of metamaterials formed by densely arrayed nanoclusters of plasmonic nanoparticles. An approximate model based on the single dipole approach in conjunction with the multipole expansion of the scattered field is used to evaluate the electric and magnetic polarizabilities of the nanocluster. Then, the permittivity and permeability of the composite medium are estimated by the Maxwell Garnett homogenization model. Results obtained from these approximatations are compared with data from full-wave simulations, focusing on the characterization of the nanocluster resonant isotropic electric and magnetic responses to an incident wave field, and the possibility to realize an isotropic negative index materials at optical frequencies..
  • Keywords
    magnetic permeability; metamaterials; nanocomposites; nanoparticles; nanophotonics; permittivity; plasmonics; polarisability; refractive index; Maxwell Garnett homogenization model; composite medium; densely arrayed nanoclusters; electric polarizability; electromagnetic properties; full-wave simulations; incident wave field; isotropic negative index materials; magnetic polarizability; multipole expansion; optical frequencies; permeability; permittivity; plasmonic nanoparticles; raspberry-like nanocluster metamaterials; resonant isotropic electric response; resonant isotropic magnetic response; single dipole approach; Magnetic cores; Magnetic materials; Magnetic resonance; Metamaterials; Optical polarization; Permeability; Permittivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE
  • Conference_Location
    Toronto, ON
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-4967-5
  • Type

    conf

  • DOI
    10.1109/APS.2010.5561250
  • Filename
    5561250