Title :
An Emulation Technique for Diagnosis and Failure Analysis of ATE
Author :
Hashempour, Hamidreza ; Lombardi, Fabrizio ; Mehta, Rakesh ; Alton, Timothy ; Necoechea, Warren
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA
Abstract :
This paper deals with a novel emulation technique which is applicable to the diagnosis and failure analysis of automatic-test-equipment (ATE) as widely used for testing integrated circuits (ICs) at manufacturing. Due to their complexity, manufacturers are facing substantial difficulties in diagnosing ATEs. In this paper, we present a novel emulation-based technique by establishing an integrated environment for the execution of hardware description language (HDL) tests (which were developed for design verification of the HDL models) on the manufactured ATE. Possible failure information is back annotated into the HDL models to locate the errors. Diagnosis and design engineering teams can then cooperate within a single environment
Keywords :
automatic test equipment; failure analysis; fault diagnosis; integrated circuit testing; reliability; HDL models; automatic-test-equipment; design verification; failure analysis; failure information; hardware description language; integrated circuit testing; integrated environment; Automatic testing; Circuit testing; Emulation; Failure analysis; Hardware design languages; Integrated circuit manufacture; Integrated circuit testing; Manufacturing automation; Pulp manufacturing; Virtual manufacturing; ATE; Diagnosis; Failure Analysis; HDL; Ver-ilog; Verification;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328291
