Title :
Hollow beam profile in the extraction system of ECR ion source
Author :
Batygin, Y. ; Goto, A. ; Yano, Y.
Author_Institution :
RIKEN, Inst. of Phys. & Chem. Res., Saitama, Japan
Abstract :
Nonlinear optics effect of the beam extracted from ECR ion source is studied. Hollow beam formation due to aberrations of einzel lens is examined both numerically and analytically. Description of beam intensity redistribution due to nonlinear focusing field is given. The analytical relationship between the initial and the final beam distribution in the extraction region is derived
Keywords :
aberrations; ion optics; ion sources; particle beam extraction; particle beam focusing; ECR ion source; beam intensity redistribution; einzel lens; extraction system; final beam distribution; hollow beam profile; nonlinear focusing field; nonlinear optics effect; Convergence; Equations; Ion sources; Lenses; Magnetic fields; Optical beams; Particle beams; Plasma properties; Plasma temperature; Space charge;
Conference_Titel :
Particle Accelerator Conference, 1995., Proceedings of the 1995
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-2934-1
DOI :
10.1109/PAC.1995.505109
