• DocumentCode
    1877472
  • Title

    Emittance measurements of the high intensity polarized ion source at IUCF

  • Author

    Derenchuk, V. ; Brown, R. ; Petri, H. ; Stephenson, E. ; Wedekind, M.

  • Author_Institution
    Cyclotron Facility, Indiana Univ., Bloomington, IN, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    1-5 May 1995
  • Firstpage
    1010
  • Abstract
    The IUCF high intensity polarized ion source (HIPIOS) is now being routinely used to deliver beam to experiments. Recent efforts have been focussed on measuring beam properties in order to improve beam transmission through the cyclotrons and maximize P2I, the product of the polarization and current delivered to the user. The results of measurements using a pepperpot beam emittance apparatus is presented relative to several source parameters
  • Keywords
    ion sources; HIPIOS; IUCF high intensity polarized ion source; beam transmission; high intensity polarized ion source; pepperpot beam emittance apparatus; polarization; source parameters; Atomic beams; Cyclotrons; Glass; Hydrogen; Ion beams; Ion sources; Neutrons; Particle beams; Plasma sources; Polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1995., Proceedings of the 1995
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    0-7803-2934-1
  • Type

    conf

  • DOI
    10.1109/PAC.1995.505112
  • Filename
    505112
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1877472