Title :
Emittance measurements of the high intensity polarized ion source at IUCF
Author :
Derenchuk, V. ; Brown, R. ; Petri, H. ; Stephenson, E. ; Wedekind, M.
Author_Institution :
Cyclotron Facility, Indiana Univ., Bloomington, IN, USA
Abstract :
The IUCF high intensity polarized ion source (HIPIOS) is now being routinely used to deliver beam to experiments. Recent efforts have been focussed on measuring beam properties in order to improve beam transmission through the cyclotrons and maximize P2I, the product of the polarization and current delivered to the user. The results of measurements using a pepperpot beam emittance apparatus is presented relative to several source parameters
Keywords :
ion sources; HIPIOS; IUCF high intensity polarized ion source; beam transmission; high intensity polarized ion source; pepperpot beam emittance apparatus; polarization; source parameters; Atomic beams; Cyclotrons; Glass; Hydrogen; Ion beams; Ion sources; Neutrons; Particle beams; Plasma sources; Polarization;
Conference_Titel :
Particle Accelerator Conference, 1995., Proceedings of the 1995
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-2934-1
DOI :
10.1109/PAC.1995.505112
