• DocumentCode
    1877496
  • Title

    Naive Bayes Software Defect Prediction Model

  • Author

    Wang Tao ; Li Wei-hua

  • Author_Institution
    Sch. of Comput. Sci. & Technol., Northwestern Polytech. Univ., Xi´an, China
  • fYear
    2010
  • fDate
    10-12 Dec. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Although the value of using static code attributes to learn defect predictor has been widely debated, there is no doubt that software defect predictions can effectively improve software quality and testing efficiency. Many data mining methods have already been introduced into defect predictions. We noted there have several versions of defect predictor based on Naive Bayes theory, and analyzed their difference estimation method and algorithm complexity. We found the best one which is Multi- variants Gauss Naive Bayes (MvGNB) by performing prediction performance evaluation, and we compared this model with decision tree learner J48. Experiment results on the benchmarking data sets of MDP made us believe that MvGNB would be useful for defect predictions.
  • Keywords
    Bayes methods; Gaussian processes; data mining; decision trees; program testing; software quality; software reliability; MvGNB; data mining methods; decision tree; multivariant Gauss Naive Bayes method; software defect prediction; software quality; software testing; static code attributes; Computational modeling; Data mining; Data models; Measurement; Object oriented modeling; Predictive models; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence and Software Engineering (CiSE), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5391-7
  • Electronic_ISBN
    978-1-4244-5392-4
  • Type

    conf

  • DOI
    10.1109/CISE.2010.5677057
  • Filename
    5677057