IEEE TC-10: Update 2006

Author

Linnenbrink, Thomas E. ; Boyer, William B. ; Paulter, Nicholas G., Jr. ; Tilden, Steven J.

Author_Institution

Waveform Generation, Meas., & Anal. Comm., Hittite Microwave Corp., Colorado Springs, CO

fYear

2006

fDate

24-27 April 2006

Firstpage

130

Lastpage

133

Abstract

There is a need throughout the world for uniform test methods for devices used to generate, measure, and analyze waveforms. Technical committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the Instrumentation and Measurement (I&M) Society, is tasked to develop standards to address these needs. To date, standards have been developed for digitizing waveform recorders, analog-to-digital converters, and transitions, pulses, and related waveforms. A standard for digital-to-analog converters is in progress

Keywords

IEEE standards; analogue-digital conversion; digital-analogue conversion; measurement standards; waveform generators; IEEE TC-10; IEEE standards; Instrumentation and Measurement Society; analog-to-digital converters; digital-to-analog converters; technical committee 10; waveform analysis; waveform generation; waveform measurement; waveform recorders; Analog-digital conversion; Digital-analog conversion; Instruments; Manufacturing; Measurement standards; NIST; Pulse measurements; Standards development; Testing; USA Councils; ADC; DAC; Digitizing Waveform Recorder; IEEE Std 1057; IEEE Std 1241; IEEE Std 1658 (Draft); IEEE Std 181; Measurement; Pulse;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE

Conference_Location

Sorrento

ISSN

1091-5281

Print_ISBN

0-7803-9359-7

Electronic_ISBN

1091-5281

Type

conf

DOI

10.1109/IMTC.2006.328299

Filename

4124292