Title :
Time efficient method for MOS circuit extraction
Author :
Doerffer, K. ; Anton, O. ; Mlynski, D.A.
Author_Institution :
Universitaet Karlsruhe
Keywords :
Algorithm design and analysis; Circuit analysis; Circuit testing; Contacts; Data mining; Geometry; Integrated circuit interconnections; Optimization methods; Shape; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
