Title :
Test generation for BiCMOS circuits
Author :
Menon, S.M. ; Jayasumana, Anura P. ; Malaiya, Yashwant K.
Author_Institution :
Colorado State University
Keywords :
BiCMOS integrated circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Delay; Integrated circuit modeling; Semiconductor device modeling; Sequential analysis; Voltage;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
