DocumentCode
1878003
Title
Test generation for BiCMOS circuits
Author
Menon, S.M. ; Jayasumana, Anura P. ; Malaiya, Yashwant K.
Author_Institution
Colorado State University
fYear
1993
fDate
3-6 May 1993
Firstpage
1987
Lastpage
1990
Keywords
BiCMOS integrated circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Delay; Integrated circuit modeling; Semiconductor device modeling; Sequential analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location
IEEE
Print_ISBN
0-7803-1281-3
Type
conf
Filename
693067
Link To Document