Title :
A logic-enhanced memory for digital data recovery circuits
Author :
Schultz, K.J. ; Gulak, P. Glenn
Author_Institution :
University of Toronto
Keywords :
Baseband; Circuit noise; Degradation; Digital communication; Hardware; Integrated circuit reliability; Intersymbol interference; Sampling methods; Signal analysis; Synchronization;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3