Title :
Evaluation of a SiC power module using low-on-resistance IEMOSFET and JBS for high power density power converters
Author :
Takao, Kazuto ; Shinohe, Takashi ; Harada, Shinsuke ; Fukuda, Kenji ; Ohashi, Hiromishi
Author_Institution :
Corporative R&D Center, Toshiba Corp., Kawasaki, Japan
Abstract :
In high-power density power converter designs, power losses of power devices are essential design parameters. Silicon-carbide (SiC) power devices are expected as next generation power devices due to their superior performances compared to conventional silicon (Si) power devices. The power loss performances of a SiC power module using SiC Implantation and Epitaxial MOSFET (SiC-IEMOSFET) and Junction barrier controlled Schottky Diode (SiC-JBS) has been evaluated based on parameters of the junction temperature, current density, and switching frequency. The advantage of the SiC power module compared to a latest Si-IGBT and SiC-diode hybrid-pair module are discussed from the view point of the power loss reduction.
Keywords :
MOSFET; Schottky barriers; Schottky diodes; power convertors; silicon compounds; wide band gap semiconductors; Si-IGBT; SiC; SiC power module evaluation; current density; diode hybrid-pair module; epitaxial MOSFET; high-power density power converter designs; junction barrier controlled Schottky diode; junction temperature; low-on-resistance IEMOSFET; power losses; switching frequency; Current density; MOSFET circuits; Multichip modules; Performance evaluation; Power MOSFET; Schottky diodes; Silicon carbide; Switching frequency; Temperature dependence; Voltage;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
Conference_Location :
Palm Springs, CA
Print_ISBN :
978-1-4244-4782-4
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2010.5433514