DocumentCode :
1878702
Title :
New Measurement Probe for High Impedance Spectroscopy
Author :
Hoja, Jerzy ; Lentka, Grzegorz
Author_Institution :
Dept. of Metrol. & Electron. Syst., Gdansk Univ. of Technol.
fYear :
2006
fDate :
24-27 April 2006
Firstpage :
323
Lastpage :
328
Abstract :
The paper presents a new measurement probe working as the input circuit for a high impedance spectroscopy analyzer. The probe allows to measure impedance in the range of 100Omega<|Zx|<100GOmega. The probe extracts two signals proportional to current through and voltage across the measured impedance in a wide frequency range from 100muHz to 1MHz. By the use of a current-to-voltage converter the influence of capacitance of the shielded cables connecting the object under measurement on the result of the measurement is kept as low as possible. An analysis of the probe has been performed taking into account most important parameters influencing the measurement accuracy: parasitic capacitance and real-life parameters of operational amplifiers in use. The formula for calculation of the modulus and argument of the measured impedance has been developed taking into account the correction for real-life parameters of the probe. This allows to decrease the maximal measurement errors of the impedance modulus to ca. 2% and of the impedance argument to 2deg, respectively, in the whole range of measurement frequencies
Keywords :
electric impedance measurement; probes; spectroscopy; current-to-voltage converter; high impedance measurement; high impedance spectroscopy; impedance modulus; maximal measurement errors; measurement probe; operational amplifiers; parasitic capacitance; shielded cables; spectroscopy analyzer; Cable shielding; Capacitance measurement; Circuits; Current measurement; Electrochemical impedance spectroscopy; Frequency measurement; Impedance measurement; Parasitic capacitance; Probes; Voltage measurement; high impedance measurement; impedance spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
ISSN :
1091-5281
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2006.328437
Filename :
4124336
Link To Document :
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