DocumentCode
1879222
Title
Learning distance metric for semi-supervised image segmentation
Author
Jia, Yangqing ; Zhang, Changshui
Author_Institution
Dept. of Autom., Tsinghua Univ., Beijing
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
3204
Lastpage
3207
Abstract
Semi-supervised image segmentation is an important issue in many image processing applications, and has been a popular research area recently, the most popular are graph-based methods. However, parameter selection in these methods is still largely heuristic. In this paper, we introduce distance metric learning into graph-based semi-supervised segmentation to automatically obtain good results for images with different appearances. We first derive the optimization problem with respect to the distance metric as well as the segmentation labels, and use gradient descent method to find a local optimum solution. Experiments on general images and the fungal disease analysis application have shown that our method provides a steady performance under casual user annotations and different image appearances.
Keywords
image segmentation; learning (artificial intelligence); fungal disease analysis; gradient descent method; graph-based methods; image processing; learning distance metric; semi-supervised image segmentation; Automation; Crops; Diseases; Image analysis; Image processing; Image segmentation; Laboratories; Laplace equations; Pixel; Semisupervised learning; Semi-supervised; distance metric learning; image segmentation;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1522-4880
Print_ISBN
978-1-4244-1765-0
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2008.4712477
Filename
4712477
Link To Document