• DocumentCode
    1879222
  • Title

    Learning distance metric for semi-supervised image segmentation

  • Author

    Jia, Yangqing ; Zhang, Changshui

  • Author_Institution
    Dept. of Autom., Tsinghua Univ., Beijing
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    3204
  • Lastpage
    3207
  • Abstract
    Semi-supervised image segmentation is an important issue in many image processing applications, and has been a popular research area recently, the most popular are graph-based methods. However, parameter selection in these methods is still largely heuristic. In this paper, we introduce distance metric learning into graph-based semi-supervised segmentation to automatically obtain good results for images with different appearances. We first derive the optimization problem with respect to the distance metric as well as the segmentation labels, and use gradient descent method to find a local optimum solution. Experiments on general images and the fungal disease analysis application have shown that our method provides a steady performance under casual user annotations and different image appearances.
  • Keywords
    image segmentation; learning (artificial intelligence); fungal disease analysis; gradient descent method; graph-based methods; image processing; learning distance metric; semi-supervised image segmentation; Automation; Crops; Diseases; Image analysis; Image processing; Image segmentation; Laboratories; Laplace equations; Pixel; Semisupervised learning; Semi-supervised; distance metric learning; image segmentation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4712477
  • Filename
    4712477