DocumentCode
1879343
Title
Sample sealing approaches for Mars Sample Return caching
Author
Younse, Paulo ; De Alwis, Thimal ; Backes, Paul ; Trebi-Ollennu, Ashitey
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear
2012
fDate
3-10 March 2012
Firstpage
1
Lastpage
11
Abstract
Sealing methods for encapsulating samples in 1 cm diameter thin-walled sample tubes applicable to future proposed Mars Sample Return missions were investigated based on power requirements, operation in the Martian environment, dust tolerance, shock and vibration, maintenance of sample integrity, hermeticity, packaging requirements, mission risk, and ability for autonomy. Techniques implemented include a spring energized Teflon sleeve plug, a crimped tube seal, a heat-activated shape memory alloy plug, a shape memory alloy activated cap, a solder-based plug, and a solder-based cap. Testing will be performed on the prototypes to determine their sensitivity to particle contamination along the sealing surface, Helium leak rate, and survivability over a range of temperatures to help recommend sealing techniques for the proposed Mars Sample Return campaign.
Keywords
astronomical instruments; sealing materials; Mars Sample Return caching; Mars Sample Return campaign; Mars Sample Return missions; Martian environment; activated shape memory alloy plug; crimped tube seal; dust tolerance; encapsulating samples; helium leak rate; hermeticity; mission risk; packaging requirements; particle contamination; power requirements; sample integrity; sample sealing approaches; sealing surface; sealing techniques; shape memory alloy activated cap; solder-based cap; solder-based plug; spring energized Teflon sleeve plug; thin-walled sample tubes; Electron tubes; Heating; Mars; Plugs; Seals; Springs; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2012 IEEE
Conference_Location
Big Sky, MT
ISSN
1095-323X
Print_ISBN
978-1-4577-0556-4
Type
conf
DOI
10.1109/AERO.2012.6187048
Filename
6187048
Link To Document