• DocumentCode
    1879786
  • Title

    Remote Control for Microscopy Applications

  • Author

    Mighela, F. ; Perra, C.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Cagliari Univ.
  • fYear
    2006
  • fDate
    24-27 April 2006
  • Firstpage
    530
  • Lastpage
    535
  • Abstract
    The first remote instruments have been used during the World War I. Starting from this moment an increasing number of instruments has become remote controlled. Despite the many announcements, real remote control has not been achieved for a vast class of instruments. The paper proposes an application to remote control a scanning electron microscope
  • Keywords
    scanning electron microscopes; scanning electron microscopy; telecontrol; remote control; scanning electron microscope; Bandwidth; Collaboration; Computer aided manufacturing; Electron microscopy; IEEE news; Instrumentation and measurement; Instruments; Laboratories; Pressure measurement; Scanning electron microscopy; Remote Control; Scanning Electron Microscope (SEM);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
  • Conference_Location
    Sorrento
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-9359-7
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2006.328584
  • Filename
    4124383
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1879786