• DocumentCode
    1879872
  • Title

    Two-Dimensional MEMS Scanner for Dual-Axes Confocal in Vivo Microscopy

  • Author

    Ra, H. ; Taguchi, Y. ; Lee, D. ; Piyawattanametha, W. ; Solgaard, O.

  • Author_Institution
    Edward L. Ginzton Laboratory, Department of Electrical Engineering, Stanford University, USA
  • fYear
    2006
  • fDate
    2006
  • Firstpage
    862
  • Lastpage
    865
  • Abstract
    This paper presents a two-dimensional (2-D) MicroElectroMechanical system (MEMS) scanner that enables dual-axes confocal microscopy. Dual-axes confocal microscopy provides high resolution in both transverse and axial directions, and is also well-suited for miniaturization and integration into endoscopes for in vivo imaging. A gimbaled MEMS scanner is fabricated on a double silicon-on-insulator (SOI) wafer (a silicon wafer bonded on a SOI wafer) and is actuated by self-aligned, vertical, electrostatic combdrives. The imaging capability of the MEMS mirror is successfully demonstrated in a breadboard setup. Reflectance images with a field of view (FOV) of 344 μm × 417 μm are achieved at 8 frames per second. The transverse resolution is 3.94 μm and 6.68 μm for the horizontal and vertical dimensions, respectively.
  • Keywords
    Endoscopes; High-resolution imaging; Image resolution; In vivo; Microelectromechanical systems; Micromechanical devices; Microscopy; Silicon on insulator technology; Two dimensional displays; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2006. MEMS 2006 Istanbul. 19th IEEE International Conference on
  • Conference_Location
    Istanbul, Turkey
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-9475-5
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2006.1627936
  • Filename
    1627936