DocumentCode :
1879911
Title :
Sequential process modeling of SLIM substrate fabrication
Author :
Dunne, Rajiv C. ; Sitaraman, Suresh K.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1998
fDate :
15-18 Mar 1998
Firstpage :
175
Lastpage :
182
Abstract :
A parametric process modeling approach has been implemented to simulate the sequential build-up process of a multilayered substrate. Generalized deformation models with element birth and death feature is used to activate and deactivate the material layers to simulate substrate fabrication. Using process models, one can determine the warpage and also axial and interfacial stresses at any intermediate stage in the process. This process-modeling approach is in contrast to the “frozen-view” models employed by many researchers, which are shown to yield overly conservative and sometimes erroneous results, leading to non-optimal design solutions. Residual warpage results are presented for the sequential build-up of a complex multilayered substrate with thin film passives integrated within the HDI (high density interconnect) layers. In addition, a comparison with the results using a frozen-view modeling approach is presented, and an alternate improved substrate processing technique is suggested to eliminate intermediate board warpage for a single-sided multilayer construction prior to polymer deposition
Keywords :
design for manufacture; internal stresses; modelling; multichip modules; shrinkage; stress analysis; substrates; thermal expansion; thermal stresses; SLIM substrate fabrication; axial stresses; boundary conditions; element birth and death feature; frozen-view modeling comparison; generalized deformation models; geometric model; high density interconnect layers; interfacial stresses; multilayered substrate; parametric process modeling approach; sequential build-up process; sequential process modeling; single-level-integrated module; single-sided multilayer construction; substrate fabrication; thermal expansion; thin film passives; warpage; Costs; Deformable models; Electronics packaging; Fabrication; Polymers; Residual stresses; Substrates; Temperature; Thermal stresses; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials, 1998. Proceedings. 1998 4th International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-7803-4795-1
Type :
conf
DOI :
10.1109/ISAPM.1998.664457
Filename :
664457
Link To Document :
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