• DocumentCode
    1879911
  • Title

    Sequential process modeling of SLIM substrate fabrication

  • Author

    Dunne, Rajiv C. ; Sitaraman, Suresh K.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1998
  • fDate
    15-18 Mar 1998
  • Firstpage
    175
  • Lastpage
    182
  • Abstract
    A parametric process modeling approach has been implemented to simulate the sequential build-up process of a multilayered substrate. Generalized deformation models with element birth and death feature is used to activate and deactivate the material layers to simulate substrate fabrication. Using process models, one can determine the warpage and also axial and interfacial stresses at any intermediate stage in the process. This process-modeling approach is in contrast to the “frozen-view” models employed by many researchers, which are shown to yield overly conservative and sometimes erroneous results, leading to non-optimal design solutions. Residual warpage results are presented for the sequential build-up of a complex multilayered substrate with thin film passives integrated within the HDI (high density interconnect) layers. In addition, a comparison with the results using a frozen-view modeling approach is presented, and an alternate improved substrate processing technique is suggested to eliminate intermediate board warpage for a single-sided multilayer construction prior to polymer deposition
  • Keywords
    design for manufacture; internal stresses; modelling; multichip modules; shrinkage; stress analysis; substrates; thermal expansion; thermal stresses; SLIM substrate fabrication; axial stresses; boundary conditions; element birth and death feature; frozen-view modeling comparison; generalized deformation models; geometric model; high density interconnect layers; interfacial stresses; multilayered substrate; parametric process modeling approach; sequential build-up process; sequential process modeling; single-level-integrated module; single-sided multilayer construction; substrate fabrication; thermal expansion; thin film passives; warpage; Costs; Deformable models; Electronics packaging; Fabrication; Polymers; Residual stresses; Substrates; Temperature; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials, 1998. Proceedings. 1998 4th International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-7803-4795-1
  • Type

    conf

  • DOI
    10.1109/ISAPM.1998.664457
  • Filename
    664457