• DocumentCode
    1880215
  • Title

    Integrated switched-capacitor voltage doubler with clock transition periods boosting and transfer blocking techniques

  • Author

    Ngo, Phong ; Ma, Dongsheng

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ, USA
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    813
  • Lastpage
    817
  • Abstract
    In this paper, a CMOS switched-capacitor voltage doubler is proposed. It employs the techniques of clock synchronization and charge transfer blocking to minimize the reversion loss. The clock transition period detection and boosting circuit modules allow continuous charge action to the output node, which significantly improves operation performances. The proposed voltage doubler was designed using IBM 180 nm CMOS process, with a 1.2 V supply voltage. Under no-load condition, it achieves 99.92% of ideal voltage level with 8 mV voltage ripple, while consuming only 9.6 ¿W of quiescent power. With a load ranging from 20 k¿ to 200 k¿, the up-conversion ratio performs 45% better than the prior arts.
  • Keywords
    CMOS integrated circuits; capacitor switching; power convertors; synchronisation; CMOS switched-capacitor voltage doubler; boosting circuit; charge transfer blocking; clock synchronization; clock transition period boosting; integrated switched-capacitor voltage doubler; power 9.6 muW; quiescent power; resistance 20 kohm to 200 kohm; reversion loss minimization; size 180 nm; transfer blocking techniques; up-conversion ratio; voltage 1.2 V; voltage 8 mV; Boosting; Capacitors; Charge pumps; Charge transfer; Clocks; Power supplies; Switching converters; Threshold voltage; Timing; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
  • Conference_Location
    Palm Springs, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-4782-4
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2010.5433576
  • Filename
    5433576