• DocumentCode
    1880768
  • Title

    A high frequency battery model for current ripple analysis

  • Author

    Wang, Jin ; Zou, Ke ; Chen, Chingchi ; Chen, Lihua

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    676
  • Lastpage
    680
  • Abstract
    In applications where batteries work together with power electronic circuits, the current ripple generated by the power electronics will be shared by both the battery and passive components in the circuit. The amount of ripple absorbed by the battery depends on its impedance at the switching frequency of power electronics. This paper presents an impedance based high frequency battery model derived from test results of a NiMH battery using a novel battery impedance tester. The possible reasons for the battery impedance characteristics in high frequency region, including skin effect and proximity effect, are also discussed. This battery model can be directly used in current ripple analysis, passive components design and control strategy optimization of power electronic circuits. The effect of the passive component values on the battery current ripple is analyzed using the ac equivalent circuit of the test setup.
  • Keywords
    electric impedance; optimisation; passive networks; power integrated circuits; proximity effect (superconductivity); secondary cells; skin effect; battery impedance tester; battery model; control strategy optimization; current ripple analysis; high frequency battery model; passive components design; power electronic circuits; proximity effect; skin effect; switching frequency; Batteries; Circuit testing; Design optimization; Equivalent circuits; Impedance; Power electronics; Power generation; Proximity effect; Skin effect; Switching frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
  • Conference_Location
    Palm Springs, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-4782-4
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2010.5433598
  • Filename
    5433598