Title :
Negative material characterization using microstrip line structures
Author :
Boybay, Muhammed S. ; Kim, Seunghwan ; Ramahi, Omar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
Abstract :
The characteristic impedance and propagation constant formulation of conventional microstrip lines are analyzed for substrates made of negative materials. It is shown that the formulation can be used for negative material characterization when w/h is larger than 3. For narrow strips, the formulation is valid for low permittivity values. The method is a low cost and wide band characterization technique for negative material characterization.
Keywords :
microstrip lines; characteristic impedance; microstrip line structures; negative material characterization; negative materials; propagation constant formulation; Impedance; Microstrip; Permittivity; Power transmission lines; Propagation constant; Substrates;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-4967-5
DOI :
10.1109/APS.2010.5561396
